Memory Module Including A Plurality Of Integrated Circuit Memory Devices And A Plurality Of Buffer Devices In A Matrix Topology

ABSTRACT

A memory module includes a plurality of signal paths that provide data to a memory module connector interface from a plurality of respective integrated circuit buffer devices that access data from an associated plurality of integrated circuit memory devices. The memory module forms a plurality of “data slices” or a plurality of portions of the memory module data bus that is coupled to the respective integrated circuit buffer devices. Each integrated circuit buffer device is also coupled to a bus that provides control information that specifies an access to at least one integrated circuit memory devices. According to an embodiment, a SPD device stores information regarding configuration information of the memory module. In embodiments, at least one integrated circuit buffer devices access information stored in the SPD device. In a package embodiment, a package houses an integrated circuit buffer die and a plurality of integrated circuit memory dies.

This application is a divisional application of U.S. patent application Ser. No. 11/236,401 filed on Sep. 26, 2005 (still pending).

FIELD OF THE INVENTION

The present invention generally relates to integrated circuit devices, high speed signaling of such devices, memory devices, and memory systems.

BACKGROUND

Some contemporary trends predict that processors, such as general purpose microprocessors and graphics processors, will continue to increase system memory and data bandwidth requirements. Using parallelism in applications such as multi-core processor architectures and multiple graphics pipelines, processors should be able to drive increases in system bandwidths at rates some predict will be doubled every three years for the next ten years. There are several major trends in dynamic random access memory (“DRAM”) that may make it prohibitively costly and challenging to keep up with increasing data bandwidth and system memory requirements. For example, transistor speed relative to feature size improvements in a given DRAM technology node, and the rising costs of capital investment required to move DRAM technology to greater memory densities for a given DRAM die adversely affect the rate at which DRAM technology can keep pace with the increasing data bandwidth and system capacity requirements.

BRIEF DESCRIPTION OF THE DRAWINGS

Embodiments are illustrated by way of example, and not by way of limitation, in the figures of the accompanying drawings and in which like reference numerals refer to similar elements and in which:

FIG. 1 illustrates a memory module topology including a plurality of integrated circuit memory devices and a plurality of integrated circuit buffer devices;

FIG. 2 illustrates a memory module topology having a split multi-drop control/address bus;

FIG. 3 illustrates a memory module topology having a single multi-drop control/address bus;

FIG. 4 illustrates a memory module topology that provides data between each integrated circuit buffer device and a memory module connector interface;

FIG. 5 illustrates a memory module topology including a plurality of integrated circuit memory devices and a plurality of integrated circuit buffer devices with an integrated circuit buffer device for control and address information;

FIG. 6 illustrates termination of a control/address signal path in a memory module topology of FIG. 5;

FIG. 7 illustrates termination of data signal paths in a memory module topology of FIG. 5;

FIG. 8 illustrates termination of a split control/address signal path in a memory module topology of FIG. 5;

FIG. 9A illustrates a top view of a memory module topology including a plurality of integrated circuit memory devices and a plurality of integrated circuit buffer devices;

FIG. 9B illustrates a side view of a memory module topology including a plurality of integrated circuit memory devices and a plurality of integrated circuit buffer devices;

FIG. 9C illustrates a bottom view of a memory module topology including a plurality of integrated circuit memory devices and a plurality of integrated circuit buffer devices;

FIG. 10 is a block diagram illustrating a topology of a device having a plurality of integrated circuit memory dies and an integrated circuit buffer die;

FIG. 11 illustrates a multi-chip package (“MCP”) device having a plurality of integrated circuit memory dies and an integrated circuit buffer die;

FIG. 12 illustrates a packaged device having a plurality of integrated circuit memory dies and another packaged device having a buffer die; both packages are stacked and housed together in a single package-on-package (“POP”) device;

FIG. 13 illustrates a device having a plurality of integrated circuit memory devices and a buffer device that are disposed on a flexible tape;

FIG. 14 illustrates a device having a plurality of integrated circuit memory dies and a buffer die that are disposed side-by-side and housed in a package;

FIG. 15 illustrates a device having a plurality of integrated circuit memory dies and a buffer die that are housed in separate packages and integrated together into a larger POP device;

FIG. 16 illustrates a memory module topology including a serial presence detect device (“SPD”);

FIG. 17 illustrates a memory module topology with each data slice having an SPD;

FIG. 18 is a block diagram of an integrated circuit buffer die;

FIG. 19 is a block diagram of a memory device.

DETAILED DESCRIPTION

According to embodiments, a memory module includes a plurality of signal paths that provide data to a memory module connector from a plurality of respective integrated circuit buffer devices (or dies) that access the data from an associated plurality of integrated circuit memory devices (or dies). In a specific embodiment, each integrated circuit buffer device is also coupled to a bussed signal path that provides control and/or address information that specifies an access to at least one integrated circuit memory device associated with the respective integrated circuit buffer device.

According to embodiments, a memory module connector includes a control/address interface portion and a data interface portion. A control/address bus couples a plurality of integrated circuit buffer devices to the control/address interface portion. A plurality of data signal paths couple the plurality of respective integrated circuit buffer devices to the data interface portion. Each integrated circuit buffer device includes 1) an interface to couple to at least one integrated circuit memory device, 2) an interface to couple to the control/address bus and 3) an interface to couple to a data signal path in the plurality of data signal paths.

According to embodiments, a memory module may include a non-volatile memory location, for example using an electrically erasable programmable read only memory (“EEPROM”) (also known as a Serial Presence Detect (“SPD”) device), to store information regarding parameters and configuration of the memory module. In embodiments, at least one integrated circuit buffer device accesses information stored in the SPD device.

In a package embodiment, a package houses an integrated circuit buffer die and the plurality of integrated circuit memory dies. In the package, a plurality of signal paths transfer data (read and/or write data) between the integrated circuit buffer die and the plurality of integrated circuit memory dies. The integrated circuit buffer die provides control signals from an interface of the package to the plurality of integrated circuit memory dies. Data stored in memory arrays of the plurality of integrated circuit memory dies is provided to a signal path disposed on the memory module via the integrated circuit buffer die in response to the control signals. In an embodiment, the package may be a multichip package (“MCP”). In an embodiment, the plurality of integrated circuit memory dies may be housed in common or separate packages. In an embodiment described below, the memory module may include a series of integrated circuit dies (i.e., memory die and buffer die) stacked on top of one another and coupled via a signal path.

As described herein, an integrated circuit buffer device is also referred to as a buffer or buffer device. Likewise, an integrated circuit memory device is also referred to as a memory device.

In an embodiment, an integrated circuit memory device is distinguished from a memory die in that a memory die is a monolithic integrated circuit formed from semiconductor materials for storing and/or retrieving data or other memory functions, whereas an integrated circuit memory device is a memory die having at least some form of packaging or interface that allows the memory die to be accessed.

Likewise in an embodiment, an integrated circuit buffer device is distinguished from a buffer die in that a buffer die is a monolithic integrated circuit formed from semiconductor materials and performs at least one or more buffer functions described herein, whereas an integrated circuit buffer device is a buffer die having at least some form of packaging or interface that allows communication with the buffer die.

In the embodiments described in more detail below, FIGS. 1-8 illustrate control/address and data signal path topologies including a plurality of integrated circuit memory devices (or dies) and a plurality of integrated circuit buffer devices (or dies) situated on a memory module. FIGS. 10, 18, and 19 also illustrate signal path topologies including integrated circuit memory devices (or dies) and integrated circuit buffer devices (or dies) situated on a memory module as well as the operation of an integrated circuit buffer device (or die) and memory device (or die) in embodiments among other things.

FIG. 1 illustrates a memory module topology including a plurality of integrated circuit memory devices and a plurality of associated integrated circuit buffer devices. In an embodiment, a memory module 100 includes a plurality of buffer devices 100 a-d coupled to a common address/control signal path 121. Each buffer device of the plurality of buffer devices 100 a-d provides access to a plurality of respective integrated circuit memory devices 101 a-d via signal paths 102 a-d and 103. In an embodiment, respective data slices a-d are formed by one of buffers 100 a-d and sets of memory devices 101 a-d. Buffer devices 100 a-d are coupled to signal paths 120 a-d, respectively, that transfer data (read and write data) between the buffer devices 100 a-d and a memory module connector interface. In an embodiment, mask information is transferred to buffer devices 100 a-d from a memory module connector interface using signal paths 120 a-d, respectively.

In an embodiment, a data slice is a portion of the memory module data signal path (or bus) that is coupled to the respective integrated circuit buffer device. The data slice may include the full data path or portions of data paths to and from a single memory device disposed on the memory module.

Integrated circuit memory devices may be considered as a common class of integrated circuit devices that have a plurality of storage cells, collectively referred to as a memory array. A memory device stores data (which may be retrieved) associated with a particular address provided, for example, as part of a write or read command. Examples of types of memory devices include dynamic random access memory (“DRAM”), including single and double data rate synchronous DRAM, static random access memory (“SRAM”), and flash memory. A memory device typically includes request or command decode and array access logic that, among other functions, decodes request and address information, and controls memory transfers between a memory array and signal path. A memory device may include a transmitter circuit to output data for example, synchronously with respect to rising and falling edges of a clock signal, (e.g., in a double data rate type of memory device). Similarly, the memory device may include a receiver circuit to receive data, for example, synchronously with respect to rising and falling edges of a clock signal or outputs data with a temporal relationship to a clock signal in an embodiment. A receiver circuit also may be included to receive control information synchronously with respect to rising and falling edges of a clock signal. In an embodiment, strobe signals may accompany the data propagating to or from a memory device and that data may be captured by a device (e.g., memory device or buffer, or controller) using the strobe signal.

In an embodiment, an integrated circuit buffer device is an integrated circuit that acts as an interface between a memory module connector interface and at least one integrated circuit memory device. In embodiments, the buffer device may store and/or route data, control information, address information and/or a clock signal to at least one integrated circuit memory device that may be housed in a common or separate package. In an embodiment, the buffer isolates, routes and/or translates data, control information and a clock signal, singly or in combination, between a plurality of memory devices and a memory module connector interface. An embodiment of a memory module connector interface is described below and shown in FIGS. 9A-C.

At least one signal path 121, as shown in FIG. 1, disposed on memory module 100, transfers control and/or address (control/address) information between at least one of the buffer devices 100 a-d and a memory module connector interface in various embodiments. In an embodiment, signal path 121 is a multi-drop bus. As illustrated in FIGS. 2-8 and described below, alternate topologies for transferring control/address information, data and clock signals between one or more buffer devices 100 a-d and a memory module connector interface may be used in alternate embodiments. For example, a split multi-drop control/address bus, segmented multi-drop control/address bus, and point-to-point and/or daisy chain topologies for a data bus may be employed.

In an embodiment, clock signals and/or clock information may be transferred on at least one signal line in signal path 121. These clock signal(s) provide one or more clock signals having a known frequency and/or phase. In an embodiment, a clock signal is synchronized with or travels along side the control/address information. In an embodiment, an edge of the clock signal has a temporal relationship with an edge of a control/address signal representing the control/address information. In an embodiment, a clock signal is generated by a clock source, master device (e.g., controller device) and/or buffer device.

In an embodiment, a clock signal and/or clock information may be transferred on at least one signal line in respective signal paths 120 a-d. Buffer devices 100 a-d may receive and/or transmit a clock signal with data on signal paths 120 a-b. In an embodiment, write data is provided to buffer devices 100 a-d on signal paths 120 a-d and a clock signal is provided on signal path 120 a-d along side write data. In an embodiment, a clock signal (such as a clock-to-master (“CTM”)) is provided from buffer devices 100 a-d on signal path 120 a-d along side read data on signal paths 120 a-d. In an embodiment, a clock signal is synchronized with or travels along side the write and/or read data. An edge of the clock signal has a temporal relationship or is aligned with an edge of a data signal representing write and/or read data. Clock information can be embedded in data, eliminating the use of separate clock signals along with the data signals.

In an embodiment, a read, write and/or bi-directional strobe signal may be transferred on at least one signal line in respective signal paths 120 a-d. Buffer devices 100 a-d may receive and/or transmit a strobe signal with data on signal paths 120 a-b. In an embodiment, write data is provided to buffer devices 100 a-d on signal paths 120 a-d and a strobe signal is provided on signal path 120 a-d along side write data. In an embodiment, a strobe signal is provided from buffer devices 100 a-d on signal path 120 a-d along side read data on signal paths 120 a-d. In an embodiment, a strobe signal is synchronized with or travels along side the write and/or read data. An edge of the strobe signal has a temporal relationship or is aligned with an edge of a data signal representing write and/or read data.

In an embodiment, addresses (for example, row and/or column addresses) for accessing particular memory locations in a particular integrated circuit memory device and/or commands are provided on signal path 121 from a memory module connector interface. In an embodiment, a command relates to a memory operation of a particular integrated circuit memory device. For example, a command may include a write command to store write data at a particular memory location in a particular integrated circuit memory device and/or a read command for retrieving read data stored at a particular memory location from a particular integrated circuit memory device. Also, multiple memory devices in different data slices can be accessed simultaneously. In embodiments, a command may include row commands, column commands such as read or write, mask information, precharge and/or sense command. In an embodiment, control information is transferred on signal path 121 over a common set of lines in the form of a time multiplexed packet where particular fields in the packet are used for including command operation codes and/or addresses. Likewise, packets of read data may be transferred from integrated circuit memory devices via buffers 100 a-d on respective signal paths 120 a-d to memory module connector interface. In an embodiment, a packet represents one or more signals asserted at particular bit windows (or a time interval) for asserting a signal on particular signal lines.

In embodiments, memory module 100 communicates (via a memory module connector interface) with a master device (e.g., a processor or controller).

FIG. 2 illustrates an embodiment of a memory module topology having a split multi-drop control/address/clock bus. In particular, memory module 200 includes a split multi-drop control/address bus 221 coupled to buffers 100 a-d and a memory module connector interface. With reference to FIG. 2, a first portion of bus 221 is terminated by termination 230 and a second portion of bus 221 is terminated by termination 231. In an embodiment, the impedance of termination 230 matches the impedance of the first portion of bus 221 (Z0) coupled to buffers 100 c-d and the impedance of termination 231 matches the impedance of the second portion of bus 221 (Z1) coupled to buffers 100 a-b. In an embodiment, impedance Z0 equals impedance Z1. In embodiments, terminations 230 and 231, singly or in combination, are disposed on memory module 100, buffer devices 100 a and 100 d or packages used to house buffer devices 100 a and 100 d.

FIG. 3 illustrates a memory module topology having a single multi-drop control/address/clock bus terminated by termination 330. In an embodiment, the impedance of termination 330 matches the impedance of signal path 121 (or control/address/clock bus). In embodiments, termination 330, singly or in combination, is disposed on memory module 300 or on buffer device 100 d.

FIG. 4 illustrates a memory module topology that provides data between each integrated circuit buffer device and a memory module connector interface. In an embodiment, each signal path 120 a-d is terminated by an associated termination 420 a-d, respectively. In an embodiment, terminations 420 a-d have respective impedances that match the impedance Z0 of each of the signal paths 120 a-d. In embodiments, terminations 420 a-d, singly or in combination, are disposed on memory module 400, each of buffer devices 100 a-d or packages used to house buffer devices 100 a-d.

Referring to FIG. 1, a control/address signal rate ratio of signal path 121 to signal path 103 may be 2:1 (or other multiples such as 4:1, 8:1, etc.) so that a memory module connector interface is able to operate as fast as specified while memory devices 101 a-d may operate at half (quarter, eighth, etc) the control/address signaling rate so that relatively lower cost memory devices may be used. Similarly, a data signal rate of one of signal paths 102 a-d to one of signal paths 120 a-d may be 2:1 (or other multiple such as 4:1, 8:1, etc) so that a memory module connector interface is able to operate as fast as specified while memory devices 101 a-d may operate at half (quarter, eighth, etc.) the data signaling rate so that relatively lower cost memory devices may be used.

FIG. 5 illustrates a memory module topology including a plurality of integrated circuit memory devices and a plurality of integrated circuit buffer devices with an integrated circuit buffer device 501 for control, address and/or clock information. Memory module 500 is similar to memory module 100 except that buffer device 501 is coupled to signal paths 121 and 121 a-b. Buffer device 501 outputs control, address and/or clock information to buffer devices 100 a-b on signal path 121 a and to buffer devices 100 c-d on signal path 121 b. In an embodiment buffer device 501 copies control, address and/or clock information received on signal path 121 and repeats the control, address and/or clock information on signal paths 121 a-b. In an embodiment, buffer device 501 is a clocked buffer device that provides a temporal relationship with control and address information provided on signal paths 121 a-b. In an embodiment, signal paths 121 a-b include at least one signal line to provide a clock signal and/or clock information. In an embodiment, buffer device 501 includes a clock circuit 1870 as shown in FIG. 18. In an embodiment, buffer device 501 receives control information, such as a packet request, that specifies an access to at least one of the integrated circuit memory devices 101 a-d and outputs a corresponding control signal (on signal path 121 a and/or 121 b) to the specified integrated circuit memory device.

FIG. 6 illustrates a memory module topology similar to that illustrated in FIG. 5 except that a termination 601 is coupled to signal path 121 on memory module 600. In an embodiment, the impedance of termination 601 matches the impedance Z0 of signal path 121. In embodiments, termination 601 is disposed on memory module 600, buffer device 501 or a package used to house buffer device 501.

FIG. 7 illustrates a memory module topology that provides data to and/or from each integrated circuit buffer device and terminations coupled to signal paths. In an embodiment, each signal path 120 a-d is terminated by associated terminations 701 a-d, respectively. In an embodiment, terminations 701 a-d have respective impedances that match the impedance Z0 of each of the signal paths 120 a-d. In embodiments, terminations 701 a-d, singly or in combination, are disposed on memory module 700, buffer devices 100 a-d or packages used to house buffer devices 100 a-d.

FIG. 8 illustrates a memory module topology having a split multi-drop signal path between a buffer device for control, address and/or clock information and the plurality of buffer devices. In particular, memory module 800 includes a split multi-drop control/address bus 121 a-b coupled to buffers 100 a-d and a buffer device 501. In an embodiment, a first portion of bus 121 a is terminated by termination 801 and a second portion of bus 121 b is terminated by termination 802. In an embodiment, the impedance of termination 801 matches the impedance of the first leg (Z0) and the impedance of termination 802 matches the impedance of the second leg (Z1). In an embodiment, impedance Z0 equals impedance Z1. In embodiments, terminations 801 and 802, singly or in combination, are disposed on memory module 800, buffer devices 100 a and 100 d or packages used to house buffer devices 100 a and 100 d.

Referring to FIG. 5, a control/address signal rate ratio of signal path 121 to signal path 121 a (or 121 b) to signal path 103 may be 2:1:1 (or other multiples such as 4:1:1, 8:1:1, etc.) so that other multi-drop bus topology embodiments using signal paths 121 a (or 121 b) and signal path 103 do not have to necessarily operate as high a signal rate as an embodiment that uses signal path 121 as shown in FIG. 1. Also like FIG. 1, a control/address signal rate ratio of signal path 121 to signal path 103 may be 2:1 (or other multiples such as 4:1, 8:1, etc.) so that a memory module connector interface is able to operate as fast as specified while memory devices 101 a-d may operate at half (or quarter, eighth, etc.) the control/address signaling rate so that relatively lower cost memory devices may be used. Similarly, a data signal rate of one of signal paths 102 a-d to one of signal paths 120 a-d may be 2:1 (or other multiple such as 4:1, 8:1, etc.) so that a memory module connector interface is able to operate as fast as the specified signaling rate while memory devices 101 a-d may operate at half (or quarter, eighth, etc.) the data signaling rate so that relatively lower cost memory devices may be used.

FIG. 9A illustrates a top view of a memory module topology including a plurality of integrated circuit memory devices and a plurality of integrated circuit buffer devices coupled to a connector interface. In an embodiment, memory module 900 includes a substrate 910 having a standard dual in-line memory module (“DIMM”) form factor or other module form factor standards, such as small outline DIMM (“SO-DIMM”) and very low profile DIMM (“VLP-DIMM”). In alternate embodiments, substrate 910 may be, but is not limited to, a wafer, printed circuit board (“PCB”), package substrate like BT epoxy, flex, motherboard, daughterboard or backplane, singly or in combination.

In an embodiment, memory module 900 includes pairs of memory devices 101 a-b and buffer devices 100 a-d disposed on a first side of substrate 910. In alternate embodiments, more or less memory devices and buffer devices are used. In an embodiment, pairs of memory devices 101 c-d are also disposed on a second side of memory module 900 as shown in a side and bottom view of memory module 900 in FIGS. 9B and 9C. In an embodiment, each memory device and buffer device are housed in separate packages. In alternate embodiments, memory devices and buffer devices may be housed in MCP package embodiments described herein.

Memory module 900 includes connector interface 920 that has different interface portions for transferring data and control/address/clock signals. For example, a first side of memory module 900 includes connector interface portions 920 a-d used to transfer data signals and a connector interface portion 930 a used to transfer control/address signals. In an embodiment, connector interface portion 930 a also transfers a clock signal and/or clock information. In an embodiment, a second side of memory module 900 including connector interface portions 920 e-h are used to transfer data signals and a connector interface portion 930 b is used to transfer control/address signals. In an embodiment, connector interface portion 930 b also transfers a clock signal and/or clock information.

In an embodiment, connector interface 920 is disposed on an edge of substrate 910. In an embodiment, a memory module 900 is inserted into a socket 940 disposed on substrate 950. In an embodiment, substrate 950 is a main board or PCB with signal paths 960 a-b for transferring signals on substrate 950. In an embodiment, signal paths 960 a and 960 b are signal traces or wires. In an embodiment, signal paths 960 a and 960 b are coupled to other sockets disposed on substrate 950 that may have another memory module inserted and/or coupled to a master.

In an embodiment, connector interface portions include at least one contact or conducting element, such as a metal surface, for inputting and/or outputting an electrical signal. In alternate embodiments, a contact may be in the form of a ball, socket, surface, signal trace, wire, a positively or negatively doped semiconductor region and/or pin, singly or in combination. In an embodiment, a connector interface as described herein, such as connector interface 920, is not limited to physically separable interfaces where a male connector or interface engages a female connector (or socket 940) or interface. A connector interface also includes any type of physical interface or connection, such as an interface used in a system-in-a-package (“SIP”) where leads, solder balls or connections from a memory module are soldered to a circuit board.

In an alternate embodiment, memory module 900 is included in an embedded memory subsystem, such as one in a computer graphics card, video game console or a printer. In an alternate embodiment, memory module 900 is situated in a personal computer or server.

In an embodiment, a master communicates with memory modules illustrated in FIGS. 1-9 and 16-17. A master may transmit and/or receive signals to and from the memory modules illustrated in FIGS. 1-9 and 16-17. A master may be a memory controller, peer device or slave device. In embodiments, a master is a memory controller, which may be an integrated circuit device that contains other interfaces or functionality, for example, a Northbridge chip of a chipset. A master may be integrated on a microprocessor or a graphics processor unit (“GPU”) or visual processor unit (“VPU”). A master may be implemented as a field programmable gate array (“FPGA”). Memory modules, signal paths, and a master may be included in various systems or subsystems such as personal computers, graphics cards, set-top boxes, cable modems, cell phones, game consoles, digital television sets (for example, high definition television (“HDTV”)), fax machines, cable modems, digital versatile disc (“DVD”) players or network routers.

In an embodiment, a master, memory modules and signal paths are in one or more integrated monolithic circuits disposed in a common package or separate packages.

FIG. 10 is a block diagram illustrating and embodiment of a device 1000 having a plurality of integrated circuit memory devices 101 a-d and a buffer 100 a. Here, data (read and/or write) may be transferred between the plurality of integrated circuit memory devices 101 a-d and buffer 100 a on a signal path 1006 (data). Signal path 1006 is a signal path situated internal to device 1000 and corresponds to signal paths 1113 a-d and 1114 shown in FIG. 11. Signal path 1006 is a bus for providing bi-directional data signals between a plurality of integrated circuit memory devices 101 a-d and buffer 100 a. An example of bi-directional data signals includes signals traveling from one or more of integrated circuit memory devices 101 a-d to buffer 100 a and also signals traveling from buffer 100 a to one or more of integrated circuit memory devices 101 a-d). Signal path 1005 is a signal path internal to device 1000 and corresponds to signal paths 1116 a-d and 1117 shown in FIG. 11. Signal path 1005 is a bus for providing unidirectional control/address/clock signals from a buffer 100 a to a plurality of integrated circuit memory devices 101 a-d. In an example of a unidirectional bus, signals travel in only one direction, i.e., in this case, from only buffer 100 a to one or more of integrated circuit memory devices 101 a-d). Signal path 1005 includes individual control signal lines, for example, a row address strobe line, column address strobe line, etc., and address signal lines. Signal path 1005 may include a fly-by clock line to transfer a clock signal from buffer 100 a to integrated circuit memory devices 101 a-d. Signal path 1005 may transfer a clock signal from one or more integrated circuit memory devices 101 a-d to buffer 100 a.

In an embodiment, buffer 100 a communicates with an SPD device to store and retrieve parameters and configuration information regarding device 1000 and/or memory module 900. In an embodiment, an SPD 1002 is a non-volatile storage device. Signal path 1004 couples SPD 1002 to buffer 100 a. In an embodiment, signal path 1004 is an internal signal path for providing bi-directional signals between SPD 1002 and buffer 100 a.

In an embodiment, SPD 1002 is an EEPROM device. However, other types of SPD 1002 are possible, including but not limited to a manual jumper or switch settings, such as pull-up or pull-down resistor networks tied to a particular logic level (high or low), which may change state when a memory module is added or removed from a system.

In an embodiment, SPD 1002 is a memory device that includes registers that stores configuration information that can be easily changed via software during system operation, allowing a high degree of flexibility, and making configuration operations that are transparent to an end user.

In an embodiment illustrated in FIG. 18, functionality of the SPD mentioned above may be integrated into buffer device 100 a using a register set, such as configuration register set 1881. Referring to FIG. 18, SPD logic and interface 1820 c may be preconfigured with information pertaining to the buffer and memory devices connected to the buffer, or may store information pertaining to only one of the memory devices or the buffer device 100 a. Control inputs to the buffer may determine when a storage node within the register set will sample the information to preload or preconfigure the SPD logic and interface 1820 c. The term register may apply either to a single-bit-wide register or multi-bit-wide register.

In an embodiment illustrated by FIG. 10, SPD 1002 stores information relating to configuration information of memory module 900. For example, configuration information may include repair and redundancy information to repair a defective memory device, defective memory cells or peripheral circuits on a memory device, and/or signal path. In an embodiment, SPD configuration information includes memory module population topology, such as a number, a position and a type of memory device in a package and/or on a memory module, or rank, if any. In an embodiment, SPD configuration information includes a serialization ratio for interfaces in a buffer and/or information regarding configuring the width of a buffer. In an embodiment, SPD configuration information includes a first value that represents the desired width of buffer device 100 a or includes multiple values that represent the range of possible widths of the buffer device 100 a, and a second value that represents the desired width of interface 1820 b as illustrated in FIG. 18.

In an embodiment, SPD configuration information includes timing information or parameters for accessing memory devices, such as a time to access a row or the memory device, a time to access a column of the memory device, a time between a row access and a column access, a time between a row access and a precharge operation, a time between a row sense applied to a first bank of a memory array and a row sense applied to a second bank of the memory array and/or a time between a precharge operation applied to a first bank in a memory array and a precharge operation applied to a second bank of the memory array.

In an embodiment, the stored timing information may be expressed in terms of time units where a table of values maps specific time units to specific binary codes. During an initialization or calibration sequence, a master or a buffer may read SPD configuration information and determine the proper timing information for one or more memory devices. For example, a master may also read information representing the clock frequency of a clock signal from an SPD 1002, and divide the retrieved timing information by a clock period of a clock signal. (The clock period of the clock signal is the reciprocal of the clock frequency of the clock signal). Any remainder resulting from this division may be rounded up to the next whole number of clock cycles of the clock signal.

Signal paths 120 a and 121, as shown in FIG. 10, are coupled to buffer 100 a. In an embodiment, signal path 120 a transfers unidirectional control/address/clock signals to buffer 100 a. In an embodiment, signal path 121 transfers bi-directional or unidirectional data signals to and from buffer 100 a. Other interconnect and external connect topologies may also be used for device 1000 in alternate embodiments. For example, buffer 100 a may be coupled to a single multi-drop control bus, a split multi-drop control bus, or a segmented multi-drop bus.

In an embodiment, device 1000 has two separate power sources. Power source V1 supplies power to one or more memory devices (memory devices 101 a-d) on memory module 900. Power source V2 supplies power to one or more buffers (buffer 100 a) on memory module 900. In an embodiment, the buffer 100 a has internal power regulation circuits to supply power to the memory devices 101 a-d.

FIG. 11 illustrates a device 1100 including a plurality of integrated circuit memory dies 1101 a-d and a buffer die 1100 a housed in or upon a common package 1110 according to embodiments. As described herein in other embodiments and illustrated in FIGS. 12-15, a plurality of integrated circuit memory dies 1101 a-d and buffer 1100 a are disposed in multiple package type embodiments. For example, a plurality of integrated circuit memory dies 1101 a-d and a buffer die 1100 a may be stacked, on a flexible tape, side-by-side or positioned in separate packages on a device substrate. Buffer die 1100 a is used to provide signals, including control/address/clock information and data, between a plurality of integrated circuit memory dies 1101 a-d and a device interface 1111 that includes contacts 1104 a-f. In an embodiment, one or more contacts 1104 a-f is similar to contacts of connector interface 920. Contacts 1104 a-f are used to couple device 1100 to substrate 910, and in particular to signal paths 120 a and 121, of memory module 100 in an embodiment. Device interface 1111 also includes signal paths 1118 and 1115 to transfer signals between contacts 1104 a-f and buffer 100 a via buffer interface 1103. Signals are then transferred between a plurality of memory dies 1101 a-d and buffer die 1100 a via buffer interface 1103 and signal paths 1117 (disposed in device interface 1111) and 1116 a-d as well as signal paths 1114 (disposed in device interface 1111) and 1113 a-d. In an embodiment, spacers 1102 a-c are positioned between integrated circuit memory dies 1101 a-d. In an embodiment, spacers 1102 a-c are positioned to dissipate heat. Similarly, buffer die 1100 a is disposed away from a plurality of integrated circuit memory dies 1101 a-d to alleviate heat dissipation near the memory devices. In an embodiment, signal paths are coupled to each other and integrated circuit memory dies 1101 a-d by a solder ball or solder structure.

FIG. 12 illustrates a stacked package device 1200 having a package 1210 containing a plurality of integrated circuit memory dies 1101 a-d and a separate package 1290 having a buffer die 1100 a. Both packages 1210 and 1290 are stacked and housed to make device 1200. In an embodiment, a plurality of integrated circuit memory dies has separate packages and is stacked on package 1290. Device 1200 has similar components illustrated in FIG. 11. Buffer die 1100 a communicates with a plurality of integrated circuit memory dies 1101 a-d as described herein. Device 1200 has memory dies 1101 a-d stacked upon buffer die 1100 a and separated by contacts 1201 a-d. In an embodiment, contacts 1201 a-d are solder balls that couple signal paths 1117 and 1114 to signal paths 1202 and 1203 that are coupled to buffer interface 1103.

FIG. 13 illustrates devices 1300 and 1301 having a plurality of integrated circuit memory devices 101 a-b (101 a-c in device 1301) and a buffer device 100 a that are disposed on a flexible tape 1302 according to embodiments. Buffer device 100 a communicates with a plurality of integrated circuit memory devices as described herein. Signal path 1305 disposed on or in flexible tape 1302 transfers signals between a plurality of integrated circuit memory devices 101 a-c and buffer 100 a. Contacts, such as a grid array of balls 1304, couple each integrated circuit memory device in a plurality of integrated circuit memory devices 101 a-c and a buffer 100 a to signal path 1305 in flexible tape 1302 in an embodiment. Adhesive 1303 may be used to couple a plurality of integrated circuit memory devices 101 a-c to each other and to a buffer 100 a in an embodiment. Device 1300 and 1301 are disposed in common package in an embodiment.

FIG. 14 illustrates a device 1400 having a plurality of integrated circuit memory dies 1101 a-d and 1401 a-d and a buffer die 1100 a that are disposed side-by-side and housed in a package 1410. Device 1400 has similar components illustrated in FIG. 11. Buffer die 1100 a communicates with a plurality of integrated circuit memory dies 1101 a-d and 1401 a-d as described herein. In an embodiment, a plurality of integrated circuit memory dies 1101 a-d and 1401 a-d and a buffer die 1100 a are disposed side-by-side on a substrate 1450 that is coupled to device interface 1411. A plurality of integrated circuit memory dies 1401 a-d is separated by spacers 1402 a-c. In an embodiment, a single integrated circuit memory die 1101 d and a single integrated circuit memory die 1401 d are disposed side-by-side with buffer die 1100 a. Device interface 1411 includes contacts 1104 a-f. Signals are transferred between buffer interface 1103 and contacts 1104 a-f by signal paths 1418 and 1415. Signals are transferred between buffer interface 1103 and signal paths 1116 a-d (or integrated circuit memory dies 1101 a-d) by signal path 1417. Similarly, signals are transferred between buffer interface 1103 and signal paths 1113 a-d (or integrated circuit memory dies 1401 a-d) by signal path 1414.

FIG. 15 illustrates a device 1500 having a plurality of integrated circuit memory dies 1101 a-b and a buffer die 1100 a that are housed in separate packages 1501, 1505 and 1520, respectively. Device 1500 has similar components illustrated in FIG. 11. Buffer die 1100 a communicates with integrated circuit memory dies 1101 a-b as described herein. Integrated circuit memory dies 1101 a-b and a buffer die 1100 a are disposed on substrate 1530 that includes signal paths 1504, 1509, 1515 and 1518. Integrated circuit memory die 1101 a includes memory interface 1507 having contacts 1508. Integrated circuit memory die 1101 b includes memory interface 1503 having contacts 1541. Buffer die 1100 a includes a buffer interface 1103 having contacts 1560. Signals are transferred between buffer interface 1103 and contacts 1104 a-f by signal paths 1515 and 1518. Signals are transferred between buffer interface 1103 and integrated circuit memory die 1101 a by signal path 1509 via memory interface 1507 and contacts 1508. Similarly, signals are transferred between buffer interface 1103 and integrated circuit memory die 1101 b by signal path 1504 via memory interface 1503 and contacts 1541. As described herein, device 1500 is coupled to a memory module 900 via contacts 1104 a-f.

FIG. 16 illustrates a memory module having an SPD 1603 according to an embodiment. Memory module 1610 includes a plurality of integrated circuit memory devices (or dies) and buffer devices (or dies) disposed on substrate 930 along with SPD 1603. FIG. 16 illustrates a memory module 1610 having a single SPD 1603 that can be accessed by each buffer device 100 a-b positioned on substrate 930. Signal path 1601 allows access to SPD 1603 from connector interface 920 and one or more buffers 100 a-b. In an embodiment, signal path 1601 is a bus. SPD 1603 may have configuration and/or parameter information written to or read by a master by way of connector interface 920 and signal path 1601. Likewise, buffers 100 a-b may write to or read from SPD 1603 via signal path 1601.

FIG. 17 illustrates a memory module 1710 with each device 1711 a-b or data slice a-b having an associated SPD 1720 a-b, buffer device (or die) 100 a-b and at least one integrated circuit memory device 101 a (or die) according to an embodiment. The plurality of buffers 100 a-b and associated plurality of SPDs 1720 a-b are disposed on substrate 930. Configuration and/or parameter information is accessed from SPDs 1720 a-b using signal path 1701, which is coupled, to connector interface 920 and each SPD 1720 a-b. In particular, signal path 1701 couples SPD 1720 a-b of device 1711 a-b to connector interface 920. In an embodiment, signal path 1701 is a bus. In an alternate embodiment, signal path 1701 couples SPD 1720 a and SPD 1720 b in a daisy chain or serial topology. In an embodiment, one or more buffer devices 100 a-b of devices 1711 a-b may access (read and/or write) respective SPDs 1720 a-b. Likewise, a master may access (read and/or write) respective SPDs 1720 a-b using signal path 1701. In an embodiment, configuration and/or parameter information is transferred using a header field or other identifier so that SPDs coupled in a daisy chain may forward the SPD information to the intended destination SPD.

FIG. 18 illustrates a block diagram of a buffer device 100 a (or die, such as buffer die 1100 a) according to embodiments. Buffer 100 a includes buffer interface 1103 a, interfaces 1820 a-c, redundancy and repair circuit 1883, multiplexer 1830, request and address logic circuit 1840, data cache and tags circuit 1860, computations circuit 1865, configuration register set 1881, and clock circuit 1870, singly or in combination.

In a memory read operation embodiment, buffer 100 a receives control information (including address information) that may be in a packet format from a master on signal path 121 and in response, transmits corresponding signals to one or more, or all of memory devices 101 a-d on one or more signal paths 1005. One or more of memory devices 101 a-d may respond by transmitting data to buffer 100 a which receives the data via one or more signal paths 1006 and in response, transmits corresponding signals to a master (or other buffer). A master transmits the control information via one or more signal paths 121 and receives the data via one or more signal paths 120 a.

By bundling control and address information in packets, protocols required to communicate to memory devices 101 a-d are independent of the physical control/address interface implementation.

In a memory write operation embodiment, buffer 100 a receives control information (including address information) that may be in a packet format from a master on signal path 121 and receives the write data for one or more memory devices 101 a-d that may be in a packet format from a master on signal path 120 a. Buffer 100 a then transmits corresponding signals to one or more, or all of memory devices 101 a-d on one or more signal paths 1006 so that the write data may be stored.

A master transmits the control/address/clock information via one or more signal paths 121 and transmits the write data via one or more signal paths 120 a.

In an embodiment, simultaneous write and/or read operations may occur for different memory devices in memory devices 101 a-d.

In an embodiment, control information that is provided to buffer 100 a causes one or more memory operations (such as write and/or read operations) of one or more memory devices 100 a-d, while the same control information may be provided to buffer 100 b which causes the same memory operations of one or more memory devices 100 a-d associated with buffer 100 b. In another embodiment, the same control information may be provided to buffer 100 a and buffer 100 b, yet different memory operations occur for the one or more memory devices 100 a-d associated with each buffer 100 a-b. In an embodiment, buffer interface 1103 a couples signal paths 121 and 120 a to buffer 100 a as shown in FIG. 10. In an embodiment, buffer interface 1103 a corresponds to buffer interface 1103 shown in FIGS. 11, 12, 14 and 15. In an embodiment, buffer interface 1103 a includes at least one transceiver 1875 (i.e. transmit and receive circuit) coupled to signal path 120 a to transmit and receive data and at least one receiver circuit 1892 coupled to signal path 121 to receive control/address/clock information. In an embodiment, signal paths 121 and 120 a include point-to-point links. Buffer interface 1103 a includes a port having at least one transceiver 1875 that connects to a point-to-point link. In an embodiment, a point-to-point link comprises one or a plurality of signal lines, each signal line having no more than two transceiver connection points. One of the two transceiver connection points is included on buffer interface 1103 a. Buffer interface 1103 a may include additional ports to couple additional point-to-point links between buffer 100 a and other buffer devices on other devices and/or memory modules. These additional ports may be employed to expand memory capacity as is described in more detail below. Buffer 100 a may function as a transceiver between a point-to-point link and other point-to-point links. In an embodiment, buffer interface 1103 a includes a repeater circuit 1899 to repeat data, control information and/or a clock signal. In an embodiment, buffer interface 1103 a includes a bypass circuit 1898 to transfer signals between connector interface portions.

In an embodiment, termination 1880 is disposed on buffer 100 a and is connected to transceiver 1875 and signal path 120 a. In this embodiment, transceiver 1875 includes an output driver and a receiver. Termination 1880 may dissipate signal energy reflected (i.e., a voltage reflection) from transceiver 1875. Termination 1880, as well as other termination described herein, may be a resistor or capacitor or inductor, singly or a series/parallel combination thereof. In alternate embodiments, termination 1880 may be external to buffer 100 a. For example, termination 1880 may be disposed on a substrate 910 of a memory module 900 or on a package used to house buffer 100 a.

Interface 1820 a includes at least one transmitter circuit 1893 coupled to signal path 1005 to transmit control/address/clock information to one or more memory devices. In an embodiment, interface 1820 a includes a transceiver that may transfer control/address/clock information between buffers disposed on a common memory module or different memory modules.

Interface 1820 b includes a transceiver 1894 coupled to signal path 1006 to transfer data between buffer 100 a and one or more memory devices 101 a-d as illustrated in FIG. 10. SPD logic and interface 1820 c includes a transceiver 1896 coupled to signal path 1004 to transfer configuration and/or parameter information between buffer 100 a and an SPD 1002 as illustrated in FIG. 10. In an embodiment, interface 1820 c is used to transfer configuration and/or parameter information as illustrated in FIGS. 16 and 17.

According to an embodiment, multiplexer 1830 may perform bandwidth-concentrating operations between buffer interface 100 a and interface 1820 b as well as route data from an appropriate source (i.e. target a subset of data from memory devices, internal data, cache or write buffer). The concept of bandwidth concentration involves combining the (smaller) bandwidth of each data path coupled to a memory device in a multiple data signal path embodiment to match the (higher) overall bandwidth utilized by buffer interface 1103 a. In an embodiment, multiplexing and demultiplexing of throughput between the multiple signal paths that may be coupled to interface 1820 b and buffer interface 1103 a is used. In an embodiment, buffer 101 a utilizes the combined bandwidth of multiple data paths coupled to interface 1820 b to match the bandwidth of interface buffer interface 1103 a.

In an embodiment, data cache and tags circuit 1860 (or cache 1860) may improve memory access time by providing storage of most frequently referenced data and associated tag addresses with lower access latency characteristics than those of the plurality of memory devices. In an embodiment, cache 1860 includes a write buffer that may improve interfacing efficiency by utilizing available data transport windows over an external signal path to receive write data and address/mask information. Once received, this information is temporarily stored in a write buffer until it is ready to be transferred to at least one memory device over interface 1820 b.

Computations circuit 1865 may include a processor or controller unit, a compression/decompression engine, etc., to further enhance the performance and/or functionality of buffer 100 a. In an embodiment, computations circuit 1865 controls the transfer of control/address/clock information and data between buffer interface 1103 a and interfaces 1820 a-c.

Clock circuit 1870 may include a clock generator circuit (e.g., Direct Rambus® Clock Generator), which may be incorporated onto buffer 101 a and thus may eliminate the need for a separate clock generating device.

In an alternate embodiment, clock circuit 1870 include clock alignment circuits for phase or delay adjusting an internal clock signal with respect to an external clock signal, such as a phase lock loop (“PLL”) circuit or delay lock loop (“DLL”) circuit. Clock alignment circuits may utilize an external clock from an existing clock generator, or an internal clock generator to provide an internal clock, to generate internal synchronizing clock signals having a predetermined temporal relationship with received and transmitted data and/or control information.

In an embodiment, clock circuit 1870 receives a first clock signal having a first frequency via signal path 121 and generates a second clock signal (via interface 1820 a) to memory device 101 a using the first clock signal and also generates a third clock signal (via interface 1820 a) to memory device 101 b using the first clock signal. In an embodiment, the second and third clock signals have a predetermined temporal (phase or delay) relationship with the first clock signal.

In an embodiment, a transmit circuit (such as in transceivers 1875, 1896 and 1894 shown in FIG. 18) transmits a differential signal that includes encoded clock information and a receiver circuit (such as in transceiver 1875, 1896 and 1894) receives a differential signal that includes encoded clock information. In this embodiment, a clock and data recovery circuit (such as clock circuit 1870) is included to extract the clock information encoded with the data received by the receiver circuit. Likewise, clock information may be encoded with data transmitted by the transmit circuit. For example, clock information may be encoded onto a data signal, by ensuring that a minimum number of signal transitions occur in a given number of data bits.

In an embodiment, a transceiver 1875 transmits and receives a first type of signal (for example, a signal having specified voltage levels and timing), while transceivers 1894 (and/or transmit circuit 1893) transmits and receives a second different type of signal. For example, transceiver 1875 may transmit and receive signals for a DDR2 memory device and transceivers 1894 may transmit and receive signals for a DDR3 memory device.

In an embodiment, the control information and/or data that is provided to buffer 100 a (by way of signal paths 121 and 120) may be in a different protocol format or have different protocol features than the control information and/or data provided to one or more memory devices 100 a-d from buffer 100 a. Logic (for example computation circuit 1865) in buffer 100 a performs this protocol translation between the control information and/or data received and transmitted. A combination of the different electrical/signaling and control/data protocol constitute an interface standard in an embodiment. Buffer 100 a can function as a translator between different interface standards—one for the memory module interface (for example connector interface 920) and another for one or more memory devices 100 a-d. For example, one memory module interface standard may require reading a particular register in a particular memory device disposed on the memory module. Yet, a memory module may be populated with memory devices that do not include the register required by the memory module interface standard. In an embodiment, buffer 100 a may emulate the register required by the memory module interface standard and thus allow for the use of memory devices 100 a-d that operates under a different interface standard. This buffer functionality, combined with the module topology and architecture, enables a memory module to be socket compatible with one interface standard, while using memory devices with a different interface standard.

In an embodiment, buffer 100 a includes a redundancy and repair circuit 1883 to test and repair the functionality of memory cells, rows or banks of a memory device, entire memory devices (or periphery circuits) and/or signal paths between buffer 100 a and memory devices 101 a-d. In an embodiment, redundancy and repair circuit 1883 periodically, during a calibration operation and/or during initialization, tests one or more of memory devices 101 a-d by writing a predetermined plurality of values to a storage location in a selected memory device (for example, using transceiver 1894 and a look-up table storing the predetermined values) using a selected data path and then reading back the stored predetermined plurality of values from the selected memory device using the selected data path. In an embodiment, when the values read from the storage location of the selected memory device do not match the values written to the storage location, redundancy and repair circuit 1883 eliminates access by buffer 100 a to the selected memory device and/or selected signal path. In an embodiment, a different signal path to a different memory device may be selected and this testing function may be performed again. If selecting the different signal path results in an accurate comparison of read predetermined values to the predetermined values in redundancy and repair circuit 1883 (or a pass of the test), the different memory address to a different memory location, within or to another memory device, is selected or mapped thereafter. Accordingly, future write and/or read operations to the defective memory location will not occur.

In an embodiment, any multiplexed combination of control information (including address information) and data intended for memory devices 101 a-d coupled with buffer 100 a is received via buffer interface 1103 a, which may, for example extract the address and control information from the data. For example, control information and address information may be decoded and separated from multiplexed data on signal path 120 a and provided on signal path 1895 to request and address logic circuit 1840 from buffer interface 1103 a. The data may then be provided to configurable serialization/deserialization circuit 1891. Request and address logic circuit 1840 generates one or more control signals to transmitter circuit 1893.

Interfaces 1820 a and 1820 b include programmable features in embodiments. A number of control signal lines and/or data signal lines between buffer 100 a and memory devices 101 a-d are programmable in order to accommodate different numbers of memory devices. Thus, more dedicated control signal lines are available with an increased number of memory devices. Using programmable dedicated control lines and/or data lines avoids any possible load issues that may occur when using a bus to transfer control signals between memory devices and a buffer 100 a. In another embodiment, additional data strobe signals for each byte of each memory device may be programmed at interface 1820 b to accommodate different types of memory devices, such as legacy memory devices that require such a signal. In still a further embodiment, interface 1820 a and 1820 b are programmable to access different memory device widths. For example, interfaces 1820 a and 1820 b may be programmed to connect to 16″×4″ width memory devices, 8″×8″ width memory devices or 4″×16″ width memory devices. Likewise, buffer interface 1103 a has a programmable width for signal path 120 a.

Configurable serialization/deserialization circuit 1891 performs serialization and deserialization functions depending upon a stored serialization ratio. As a memory device access width is reduced from its maximum value, memory device access granularity (measured in quanta of data) is commensurately reduced, and an access interleaving or multiplexing scheme may be employed to ensure that all storage locations within memory devices 101 a-d can be accessed. The number of signal paths 1006 may be increased or decreased as the memory device access width changes. Signal path 1006 may be subdivided into several addressable subsets. The address of the transaction will determine which target subset of signal path 1006 will be utilized for the data transfer portion of the transaction. In addition, the number of transceiver, transmitter and/or receiver circuits included in interfaces 1820 a and 1820 b that are employed to communicate with one or more memory devices 101 a-d may be configured based on the desired serialization ratio. Typically, configuration of the transceivers may be effectuated by enabling or disabling how many transceivers are active in a given transfer between one or more memory devices 101 a-d and buffer interface 1103 a. In an embodiment, a data rate of transferring data at buffer interface 1103 a is a multiple or ratio of a data rate of transferring data on one or more signal paths 1006 coupled to memory devices 101 a-d.

Buffer 100 a provides a high degree of system flexibility. New interface standards of memory devices may be phased in to operate with a master or a memory system that supports older interface standards by modifying buffer 100 a. In an embodiment, a memory module may be inserted using an older memory module interface or socket, while newer generation memory devices may be disposed on the memory module. Backward compatibility with existing generations of memory devices may be preserved. Similarly, new generations of masters, or controllers, may be phased in which exploit features of new generations of memory devices while retaining backward compatibility with existing generations of memory devices. Similarly, different types of memory devices that have different costs, power requirements and access times may be included in a single common package for specific applications.

FIG. 19 illustrates an integrated circuit memory device 1900 (or a memory die) in an embodiment. Integrated circuit memory device 1900 corresponds to one or more integrated circuit memory devices 101 a-d in embodiments. Integrated circuit memory device 1900 includes a memory core 1900 b and a memory interface 1900 a. Signal paths 1950 a-b, 1951 a-b, 1952 and 1953 are coupled to memory interface 1900 a. Signal paths 1950 a-b transfer read and write data. Signal paths 1951 a-b transfer address information, such as a row address and a column address in packets, respectively. Signal path 1952 transfers control information. Signal path 1953 transfers one or more clock signals. In an embodiment, signal paths 1950 a-b correspond to signal path 120 a shown in FIG. 10 and signal paths 1951 a-b, 1952 and 1953 correspond to signal path 121 in FIG. 10.

Memory interface 1900 a includes at least one transmitter and/or receiver for transferring signals between memory device 1900 and signal paths 1950 a-b, 1951 a-b, 1952 and 1953. Write demultiplexer (“demux”) 1920 and read multiplexer (“mux”) 1922 are coupled to signal path 1950 a, while write demux 1921 and read mux 1923 are coupled to signal path 1950 b. Write demux 1920-21 provide write data from signal paths 1950 a-b to memory core 1900 b (in particular sense amplifiers 0-2 a and 0-2 b). Read mux 1922-23 provide read data from memory core 1900 b to signal paths 1950 a-b (in particular sense amplifiers Na and Nb).

Demux and row packet decoder 1910 is coupled to signal path 1951 a and Demux and column packet decoder 1913 is coupled to signal path 1951 b. Demux and row packet decoder 1910 decodes a packet and provides a row address to row decoder 1914. Demux and Column packet decoder 1913 provides a column address and mask information to column and mask decoder 1915.

Control registers are coupled to signal path 1952 and provide control signals to row decoder 1914 and column and mask decoder 1915 in response to register values.

A clock circuit is coupled to signal path 1953 to provide a transmit clock signal TCLK and a receive clock signal RCLK in response to one or more clock signals transferred on signal path 1953. In an embodiment, write demux 1920 and 1921 provide write data from signal paths 1950 a-b to memory core 1900 b in response to an edge of receive clock signal RCLK. In an embodiment, read mux 1922 and 1923 provide read data from memory core 1900 b to signal paths 1950 a-b in response to an edge of a transmit clock signal TCLK. In an embodiment, clock circuit generates a clock signal on signal path 1953 (to a buffer device) that has a temporal relationship with read data that are output on signal paths 1950 a-b.

Row decoder 1914 and column and mask decoder 1915 provide control signals to memory core 1900 b. For example, data stored in a plurality of storage cells in a memory bank is sensed using sense amplifiers in response to a row command. A row to be sensed is identified by a row address provided to row decoder 1914 from demux and row packet decoder 1910. A subset of the data sensed by a sense amplifier is selected in response to a column address (and possible mask information) provided by demux and column packet decoder 1913.

A memory bank in memory banks 0-N of memory core 1900 b includes a memory array having a two dimensional array of storage cells. In embodiments, memory banks 0-N include storage cells that may be DRAM cells, SRAM cells, FLASH cells, ferroelectric RAM (FRAM) cells, magnetoresistive or magnetic RAM (MRAM) cells, or other equivalent types of memory storage cells. In an embodiment, integrated circuit memory device 1900 is a DDR integrated circuit memory device or later generation memory device (e.g., DDR2 or DDR3). In an alternate embodiment, integrated circuit memory device 1900 is an XDR™ DRAM integrated circuit memory device or Direct Rambus® DRAM (“DRDRAM”) memory device. In an embodiment, integrated circuit memory device 1900 includes different types of memory devices having different types of storage cells housed in a common package.

Signals described herein may be transmitted or received between and within devices/circuits using signal paths and generated using any number of signaling techniques including without limitation, modulating the voltage or current level of an electrical signal. The signals may represent any type of control and timing information (e.g. commands, address values, clock signals, and configuration/parameter information) as well as data. In an embodiment, a signal described herein may be an optical signal.

A variety of signals may be transferred on signal paths as described herein. For example, types of signals include differential (over a pair of signal lines), non-return to zero (“NRZ”), multi-level pulse amplitude modulation (“PAM”), phase shift keying, delay or time modulation, quadrature amplitude modulation (“QAM”) and Trellis coding.

In an embodiment employing multi-level PAM signaling, a data rate may be increased without increasing either the system clock frequency or the number of signal lines by employing multiple voltage levels to encode unique sets of consecutive digital values or symbols. That is, each unique combination of consecutive digital symbols may be assigned to a unique voltage level, or pattern of voltage levels. For example, a 4-level PAM scheme may employ four distinct voltage ranges to distinguish between a pair of consecutive digital values or symbols such as 00, 01, 10 and 11. Here, each voltage range would correspond to one of the unique pairs of consecutive symbols.

In an embodiment, a clock signal is used to synchronize events in a memory module and/or device such as synchronizing receiving and transmitting data and/or control information. In an embodiment, globally synchronous clocking is used (i.e., where a single clock frequency source is distributed to various devices in a memory module/system). In an embodiment, source synchronous clocking is used (i.e., where data is transported alongside a clock signal from a source to a destination such that a clock signal and data become skew tolerant). In an embodiment, encoding data and a clock signal is used. In alternate embodiments, combinations of clocking or synchronization described herein are used.

In embodiments, signal paths described herein include one or more conducting elements, such as a plurality of wires, metal traces (internal or external), signal lines or doped regions (positively or negatively enhanced), as well as one or more optical fibers or optical pathways, singly or in combination. In embodiments, multiple signal paths may replace a single signal path illustrated in the Figures and a single signal path may replace multiple signal paths illustrated in the Figures. In embodiments, a signal path may include a bus and/or point-to-point connection. In an embodiment, signal paths include signal paths for transferring control and data signals. In an alternate embodiment, signal paths include only signals paths for transferring data signals or only signal paths for transferring control signals. In still other embodiments, signal paths transfer unidirectional signals (signals that travel in one direction) or bi-directional signals (signals that travel in two directions) or combinations of both unidirectional and bi-directional signals.

It should be noted that the various circuits disclosed herein may be described using computer aided design tools and expressed (or represented) as data and/or instructions embodied in various computer-readable media, in terms of their behavior, register transfer, logic component, transistor, layout geometries, and/or other characteristics. Formats of files and other objects in which such circuit expressions may be implemented include, but are not limited to: formats supporting behavioral languages such as C, Verilog, and HLDL; formats supporting register level description languages like RTL; formats supporting geometry description languages such as GDSII, GDSIII, GDSIV, CIF, MEBES; and any other suitable formats and languages. Computer-readable media in which such formatted data and/or instructions may be embodied include, but are not limited to, non-volatile storage media in various forms (e.g., optical, magnetic or semiconductor storage media) and carrier waves that may be used to transfer such formatted data and/or instructions through wireless, optical, or wired signaling media or any combination thereof. Examples of transfers of such formatted data and/or instructions by carrier waves include, but are not limited to, transfers (uploads, downloads, e-mail, etc.) over the Internet and/or other computer networks via one or more data transfer protocols (e.g., HTTP, FTP, SMTP, etc.). When received within a computer system via one or more computer-readable media, such data and/or instruction-based expressions of the above described circuits may be processed by a processing entity (e.g., one or more processors) within the computer system in conjunction with execution of one or more other computer programs including, without limitation, netlist generation programs, place and route programs and the like, to generate a representation or image of a physical manifestation of such circuits. Such representation or image may thereafter be used in device fabrication, for example, by enabling generation of one or more masks that are used to form various components of the circuits in a device fabrication process.

The foregoing description of several embodiments has been provided for the purposes of illustration and description. It is not intended to be exhaustive or to limit the embodiments to the precise forms disclosed. Modifications and variations will be apparent to practitioners skilled in the art. The embodiments were chosen and described in order to explain inventive principles and practical applications, thereby enabling others skilled in the art to understand various embodiments and with the various modifications as are suited to the particular use contemplated. It is intended that the scope of the invention be defined by the following claims and their equivalents. 

1. A memory module comprising: an integrated circuit memory device; and an integrated circuit buffer device coupled to the integrated circuit memory device, wherein a memory access to the integrated circuit memory device is performed via the integrated circuit buffer device, the integrated circuit buffer device including a storage circuit to store redundancy information pertaining to a defective memory cell of the integrated circuit memory device such that the integrated circuit buffer device reroutes a memory access having an address associated with the defective memory cell.
 2. The memory module of claim 1, wherein the integrated circuit buffer device reroutes the memory access having the address associated with the defective memory cell to another integrated circuit memory device.
 3. The memory module of claim 1, wherein the integrated circuit buffer device reroutes the memory access having the address associated with the defective memory cell to another address of the integrated circuit memory device.
 4. The memory module of claim 1, wherein a first plurality of values is written to the address and then a second plurality of values is read from the address to detect the defective memory cell, wherein the defective memory cell is detected when the first plurality of values does not match the second plurality of values.
 5. The memory module of claim 1, wherein the integrated circuit memory device and integrated circuit buffer device are included in a single common package.
 6. A memory module comprising: a plurality of integrated circuit memory devices, each integrated circuit memory device of the plurality of integrated circuit memory devices having an array of memory cells; and an integrated circuit buffer device coupled to the plurality of integrated circuit memory devices, wherein a memory access to the plurality of integrated circuit memory devices is performed via the integrated circuit buffer device, the integrated circuit buffer device including a storage circuit to store information pertaining to at least one defective memory cell location of at least one array of memory cells.
 7. The memory module of claim 6, wherein a first plurality of values is written to an address of an integrated circuit memory device in the plurality of integrated circuit memory devices and then a second plurality of values is read from the address of the integrated circuit memory device to detect the at least one defective memory cell location, wherein the defective memory cell location is detected when the first plurality of values does not match the second plurality of values.
 8. The memory module of claim 7, wherein, during initialization of the plurality of integrated circuit memory devices, both the first plurality of values is written and the second plurality of values is read.
 9. The memory module of claim 6, wherein the integrated circuit buffer device is included in a plurality of integrated circuit buffer devices, each integrated circuit buffer devices of the plurality of integrated circuit buffer devices coupled to a corresponding plurality of integrated circuit memory devices, wherein a memory access to each plurality of integrated circuit memory devices is performed via a corresponding integrated circuit buffer device in the plurality of integrated circuit buffer devices.
 10. The memory module of claim 9, further comprising a bus coupled to the plurality of integrated circuit buffer devices, the bus to provide control information associated with the memory access to the plurality of integrated circuit buffer devices.
 11. A memory module comprising: a plurality of integrated circuit memory devices, each integrated circuit memory device of the plurality of integrated circuit memory devices having an array of memory cells; an integrated circuit buffer device coupled to the plurality of integrated circuit memory devices, wherein a memory access to the plurality of integrated circuit memory devices is performed via the integrated circuit buffer device; and an integrated circuit storage device coupled to the integrated circuit buffer device, the integrated circuit storage device to store information pertaining to at least one defective memory cell location of at least one array of memory cells of the plurality of integrated circuit memory devices.
 12. The memory module of claim 11, when the information pertaining to at least one defective cell location is obtained during initialization of the memory module.
 13. The memory module of claim 11, wherein a first plurality of values is written to an address of an integrated circuit memory device in the plurality of integrated circuit memory devices and then a second plurality of values is read from the address of the integrated circuit memory device to detect the at least one defective memory cell location, wherein the defective memory cell location is detected when the first plurality of values does not match the second plurality of values.
 14. The memory module of claim 11, wherein the array of memory cells include dynamic random access memory cells.
 15. The memory module of claim 11, wherein the integrated circuit buffer device reroutes a memory access having an address associated with the defective memory cell location to another address in the plurality of integrated circuit memory devices.
 16. A system housed in a single semiconductor package, the system comprising: a first integrated circuit memory die having an array of memory cells; and a integrated circuit buffer die coupled to the integrated circuit memory die, wherein a memory access to the integrated circuit memory die is performed via the integrated circuit buffer die, the integrated circuit buffer die including a storage circuit to store information pertaining to at least one defective memory cell location in the array of memory cells.
 17. The system of claim 16, wherein the array of memory cells includes dynamic random access memory cells.
 18. The system of claim 17, wherein the storage circuit is a register.
 19. The system of claim 16, wherein the integrated circuit buffer die reroutes the memory access to another memory location in the array of memory cells in response to the information pertaining to at least one defective memory cell location.
 20. The system of claim 16, further comprising a second integrated circuit memory die having an array of memory cells, wherein the integrated circuit buffer die reroutes the memory access to array of memory cells of the second integrated circuit memory die in response to the information pertaining to the at least one defective memory cell location.
 21. A system comprising: a plurality of integrated circuit memory devices, each integrated circuit memory device of the plurality of integrated circuit memory devices having an array of memory cells; and a plurality of integrated circuit buffer devices coupled to the plurality of integrated circuit memory devices, wherein a memory access to an integrated circuit memory device of the plurality of integrated circuit memory devices is performed via a corresponding integrated circuit buffer device of the plurality of integrated circuit buffer devices, the corresponding integrated circuit buffer device including a storage circuit to store information pertaining to at least one defective memory cell location of at least one array of memory cells.
 22. The system of claim 21, wherein the corresponding integrated circuit buffer device accesses a first set of integrated circuit memory devices in the plurality of integrated circuit memory devices.
 23. The system of claim 21, further comprising a bus coupled to the plurality of integrated circuit buffer devices, the bus to provide control information associated with the memory access to the plurality of integrated circuit buffer devices.
 24. The system of claim 21, wherein the storage circuit includes a register to store the information pertaining to at the least one defective memory cell location.
 25. The system of claim 21, wherein the corresponding integrated circuit buffer device reroutes the memory access to another memory location in the at least one array of memory cells in response to the information pertaining to the at least one defective memory cell location. 